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Méthode de détermination rapide par diffraction électronique des faces de croissance de l'hématite
Author(s) -
Tissier F.,
Bessières J.,
Baro R.
Publication year - 1976
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889876010832
Subject(s) - goniometer , diffraction , facet (psychology) , electron diffraction , optics , crystallography , physics , materials science , chemistry , psychology , social psychology , personality , big five personality traits
A method is described for the rapid indexing of facets of crystals of hematite α‐Fe 2 O 3 from the study of electron diffraction diagrams. The only measurements consist in reading the values of the angles defining the position of the goniometer which allows rotation of the facet in its own plane.

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