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Topographic observation of micro defects ( e.g. `swirls') in nearly perfect crystals
Author(s) -
Renninger M.
Publication year - 1976
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889876010820
Subject(s) - silicon , crystal (programming language) , materials science , crystallography , optics , condensed matter physics , physics , chemistry , optoelectronics , computer science , programming language
A double‐diffractometric method for X‐ray topography revealing the smallest crystal defects in as‐grown silicon by a relatively low display is described.