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Determination of structure factors by white X‐ray diffraction from a powder sample of GaP
Author(s) -
Uno R.,
Ishigaki J.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889875011417
Subject(s) - diffraction , powder diffraction , reproducibility , dispersion (optics) , x ray , scattering , x ray crystallography , sample (material) , absorption (acoustics) , analytical chemistry (journal) , optics , materials science , chemistry , physics , crystallography , chromatography
The white X‐ray diffraction method with the use of a powder sample [Laine, Läihteenmäki & Kantola (1972). X‐ray Spectrosc . 1 , 93–98] was improved by paying special attention to the following four points: (i) the determination of the energy spectrum of incident white X‐rays, (ii) the measurement of the energy dependence of the relative absorption coefficient, (iii) the correction for the contribution from thermal diffuse scattering, and (iv) the correction for the anomalous dispersion. The determination of the structure factors of GaP is shown as an example of its applications. The structure factors determined were compared with those obtained by the usual angle dispersive method with monochromated X‐rays on the same sample. It is shown that these two sets of structure factors mostly agree within the limit of reproducibility.