Accurate lattice constants from multiple reflection measurements. II. Lattice constants of germanium silicon, and diamond | Zendy

Hom T. | Zendy; Kiszenik W. | Zendy; Post B. | Zendy

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Accurate lattice constants from multiple reflection measurements. II. Lattice constants of germanium silicon, and diamond

Author(s) -

Hom T.,

Kiszenik W.,

Post B.

Publication year - 1975

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s0021889875010965

Subject(s) - germanium , diamond , lattice constant , silicon , materials science , diamond cubic , lattice (music) , diffraction , crystallography , chemistry , optics , physics , optoelectronics , metallurgy , acoustics

The lattice constants of a diamond platelet and of large single, undoped, crystals of silicon and germanium have been determined from measurements of multiple diffraction patterns by the method described in Part I [Post (1975). J. Appl. Cryst . 8 , 452–456]. The mean values, based on measurements of eight to twelve reflections, and their standard deviations are: diamond a = 3.566986 Å, Aa / a = 2.6 × 10−6; silicon a = 5.430941 Å, Aa / a = 2 × 10−6; germanium a = 5.657820 Å, Δa / a = 1.6 × 10 −6 .

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