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Synchrotron radiation – its application to high‐speed, high‐resolution X‐ray diffraction topography
Author(s) -
Hart M.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188987501093x
Subject(s) - synchrotron radiation , lithium fluoride , synchrotron , diffraction , x ray , optics , materials science , radiation , lithium (medication) , instrumentation (computer programming) , resolution (logic) , physics , nuclear physics , computer science , medicine , artificial intelligence , endocrinology , operating system
With almost perfect silicon crystals and cleaved lithium fluoride crystals as extreme examples, the feasibility of using synchrotron radiation for X‐ray diffraction topography has been investigated. In both spatial resolution and strain resolution the synchrotron source diffraction topographs are competitive with topographs obtained using conventional X‐ray sources but exposure times are reduced from several hours per cm 2 to one second per cm 2 using standard recording techniques with Ilford nuclear emulsions. Contrary to (the author's) expectations, the instrumentation required is far simpler for synchrotron radiation than for conventional sources.