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On the method of obtaining the residual stress, stacking fault probability and other parameters from an analysis of peak shifts of several Bragg peaks
Author(s) -
Marion R. H.,
Cohen J. B.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889875010928
Subject(s) - residual stress , stacking , residual , diffraction , materials science , lattice (music) , stacking fault , stress (linguistics) , macro , statistical physics , computational physics , statistics , optics , mathematics , physics , algorithm , computer science , composite material , nuclear magnetic resonance , acoustics , linguistics , philosophy , programming language
Values of fault probabilities, lattice parameter and residual stress in deformed specimens are sometimes obtained from positions of several peaks in a standard diffraction pattern. In the light of recent results on the effects of macro‐ and micro‐stresses on peak positions, it is shown that this procedure is often inadequate and an alternative method is suggested.