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Refinement of setting angles in screenless film methods
Author(s) -
Schwager P.,
Bartels K.,
Jones A.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188987501045x
Subject(s) - intensity (physics) , crystal (programming language) , optics , materials science , geometry , computer science , physics , mathematics , programming language
For screenless X‐ray intensity‐data films the setting angles of the crystal can be derived directly from cut reflections on these films. By this means errors which arise by the transition from setting photographs to the intensity photograph are avoided, and the accuracy of the calculated setting angles is typically better than 3′. Setting photographs are only necessary for initial and approximate alignment of the crystal.