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An X‐ray cylindrical texture camera for the examination of thin films
Author(s) -
Wallace C. A.,
Ward R. C. C.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889875010424
Subject(s) - texture (cosmology) , crystallite , materials science , optics , thin film , x ray , layer (electronics) , deposition (geology) , orientation (vector space) , composite material , physics , image (mathematics) , computer science , mathematics , geometry , artificial intelligence , metallurgy , geology , nanotechnology , paleontology , sediment
An X‐ray cylindrical texture camera has been constructed for the examination of thin polycrystalline films. Information about the type and degree of preferred orientation can be obtained. In certain cases the thickness of the film can be measured, and the order of deposition determined where more than one layer is present.