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Studies of lattice defects using weak diffracted beams
Author(s) -
Cockayne D. J. H.,
Gomez A.,
Holmes S. M.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889875010321
Subject(s) - diffraction , lattice (music) , electron diffraction , materials science , electron microscope , optics , crystallography , microscopy , x ray crystallography , condensed matter physics , molecular physics , physics , chemistry , acoustics
The weak‐beam method of electron microscopy provides a means for studying lattice defects with greatly increased resolution compared with normal diffraction contrast techniques.