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The validity of the column approximation with special reference to the defocusing contrast of small cavities
Author(s) -
Rühle M.,
Wilkens M.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188987501031x
Subject(s) - contrast (vision) , diffraction , electron , wavelength , lattice (music) , electron diffraction , ordinary differential equation , column (typography) , optics , partial differential equation , physics , differential equation , high contrast , image contrast , mathematical analysis , materials science , mathematics , geometry , quantum mechanics , acoustics , connection (principal bundle)
The diffraction contrast of lattice defects on TEM images is usually calculated by application of the column approximation (CA) which assumes basically that the wavelength of the imaging electrons approaches zero. By application of the CA the diffraction contrast can be calculated by solving ordinary differential equations rather than partial differential equations.