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Theoretical basis of diffraction contrast of lattice imperfections in transmission electron microscopy
Author(s) -
Howie A.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889875010242
Subject(s) - diffraction , transmission electron microscopy , dynamical theory of diffraction , electron diffraction , electron , lattice (music) , basis (linear algebra) , electron microscope , optics , condensed matter physics , energy filtered transmission electron microscopy , selected area diffraction , reflection high energy electron diffraction , materials science , microscopy , physics , molecular physics , computational physics , scanning transmission electron microscopy , quantum mechanics , geometry , mathematics , acousto optics , acoustics , diffraction grating
The dynamical theory of diffraction, both for X‐rays and electrons, was formulated many years ago but for several decades found only limited application in the analysis of diffraction patterns because of the difficulty in obtaining specimens whose defect content was known with sufficient precision. This situation was transformed with the advent of real‐space techniques, such as transmission electron microscopy and X‐ray topography, which allowed the dynamical theory to be applied to local regions in the vicinity of individual defects instead of to the diffraction pattern coming from the specimen as a whole.