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Interpretation of X‐ray scattering patterns due to periodic structural fluctuations
Author(s) -
Böhm H.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889875010138
Subject(s) - transverse plane , interpretation (philosophy) , position (finance) , physics , scattering , periodic function , x ray , condensed matter physics , computational physics , optics , atomic physics , quantum mechanics , structural engineering , finance , computer science , engineering , economics , programming language
If the parameters of a structure are modulated by a periodic function, satellite reflexions are observed as well as the main reflexions in single‐crystal X‐ray photographs. The periodic fluctuation of atomic positions can either be a longitudinal or a transverse wave. The longitudinal and transverse periodic fluctuations of atomic position are examined.