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A precise X‐ray diffraction study of elastically deformed silicon monocrystals
Author(s) -
Baker T. W.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889875010114
Subject(s) - silicon , materials science , diffraction , x ray , crystallography , strain (injury) , optics , optoelectronics , physics , chemistry , medicine
The study originated from an investigation into the strain induced in silicon crystals when these were mounted on headers in the manufacture of electronic devices, but its development as presented is of more general interest.