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The determination of the dislocation structure in copper single crystals from X‐ray diffraction profiles
Author(s) -
Freund A.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889875010096
Subject(s) - copper , dislocation , crystallography , diffraction , x ray , x ray crystallography , materials science , chemistry , optics , metallurgy , physics
A careful analysis of X‐ray diffraction profiles obtained from copper single crystals with dislocation densities has been performed.