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Diffuse scattering studies of defects in irradiated copper
Author(s) -
Young F. W.,
Larson B. C.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889875010035
Subject(s) - irradiation , annealing (glass) , copper , scattering , crystallographic defect , materials science , neutron , dislocation , crystallography , neutron scattering , molecular physics , optics , condensed matter physics , chemistry , nuclear physics , physics , composite material , metallurgy
The integral Huang diffuse X‐ray scattering from crystals containing small dislocation loops can be analyzed to obtain two types of information: (1) the size distribution of the loops and (2) the total number of point defects contained in the loops. This technique has been applied to copper crystals irradiated under a number of conditions of neutron irradiation flux, dose and temperature, for which loops are produced, and to selected annealing studies of these loops, with all X‐ray measurements made at room temperature.