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Scattering of X‐rays by correlated defect distributions
Author(s) -
Gaal I.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889875009818
Subject(s) - intensity (physics) , kinematics , scattering , distribution (mathematics) , order (exchange) , physics , expression (computer science) , crystallography , materials science , optics , geometry , computational physics , chemistry , mathematics , classical mechanics , mathematical analysis , computer science , finance , economics , programming language
It may be essential in certain cases ( e.g . non‐dilute alloys and dislocations) to take into account the (pair and higher‐order) correlations in the defect distribution. To this end the kinematic expression for the total scattered intensity is rewritten.