A silicon powder diffraction standard reference material | Zendy

Hubbard C. R. | Zendy; Swanson H. E. | Zendy; Mauer F. A. | Zendy

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A silicon powder diffraction standard reference material

Author(s) -

Hubbard C. R.,

Swanson H. E.,

Mauer F. A.

Publication year - 1975

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s0021889875009508

Subject(s) - materials science , goniometer , powder diffraction , diffraction , tungsten , lattice constant , silicon , lattice (music) , x ray crystallography , crystallography , analytical chemistry (journal) , optics , chemistry , metallurgy , physics , chromatography , acoustics

A silicon powder Standard Reference Material, SRM‐640, has been prepared for use as a standard in powder diffractometry. Powder diffraction measurements were performed with a tungsten internal standard and a high‐angle goniometer. The measured a /λ is 3.525176. With λ(Cu K α 1 peak) taken as 1.5405981 Å, a = 5.430880 (35) Å, uncorrected for refraction. Comparison of a with values obtained with a single‐crystal from one of the boules reveals a difference of 3 parts in 10 5 . This difference suggests a subtle systematic error in powder diffractometry or a change in lattice spacing near crystal boundaries. Use of the SRM should permit individual measurements of lattice parameters to be made reproducible to near 1 part in 10 5 and an absolute accuracy of at least 3 parts in 10 5 .

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