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A silicon powder diffraction standard reference material
Author(s) -
Hubbard C. R.,
Swanson H. E.,
Mauer F. A.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889875009508
Subject(s) - materials science , goniometer , powder diffraction , diffraction , tungsten , lattice constant , silicon , lattice (music) , x ray crystallography , crystallography , analytical chemistry (journal) , optics , chemistry , metallurgy , physics , chromatography , acoustics
A silicon powder Standard Reference Material, SRM‐640, has been prepared for use as a standard in powder diffractometry. Powder diffraction measurements were performed with a tungsten internal standard and a high‐angle goniometer. The measured a /λ is 3.525176. With λ(Cu K α 1 peak) taken as 1.5405981 Å, a = 5.430880 (35) Å, uncorrected for refraction. Comparison of a with values obtained with a single‐crystal from one of the boules reveals a difference of 3 parts in 10 5 . This difference suggests a subtle systematic error in powder diffractometry or a change in lattice spacing near crystal boundaries. Use of the SRM should permit individual measurements of lattice parameters to be made reproducible to near 1 part in 10 5 and an absolute accuracy of at least 3 parts in 10 5 .