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Quantitative interpretation of X‐ray diffraction patterns of mixtures. III. Simultaneous determination of a set of reference intensities
Author(s) -
Chung F. H.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889875009454
Subject(s) - interpretation (philosophy) , diffraction , binary number , matrix (chemical analysis) , relative standard deviation , set (abstract data type) , x ray , chemistry , standard deviation , analytical chemistry (journal) , x ray crystallography , mathematics , statistics , optics , physics , chromatography , computer science , arithmetic , detection limit , programming language
A set of reference intensities, k i , are required for the quantitative interpretation of X‐ray diffraction patterns of mixtures. Each k i was heretofore determined individually from binary mixtures of a one‐to‐one weight ratio. A procedure for the determination of all k i 's of interest simultaneously is presented. The X‐ray diffraction patterns of multicomponent mixtures usually contain overlapping peaks. This overlapping problem can be avoided by choosing an arbitrary reference material already present in the mixture and/or using the strongest resolved reflections directly. These concepts are substantiated by ten examples. The maximum standard deviation of the matrix‐flushing method has been estimated to be 8% relative.