Premium
A computer‐controlled X‐ray powder diffractometer
Author(s) -
King P. J.,
Smith W. L.
Publication year - 1974
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188987401051x
Subject(s) - diffractometer , interfacing , diffraction , powder diffraction , computer science , x ray crystallography , powder diffractometer , materials science , optics , crystallography , computer hardware , physics , chemistry , scanning electron microscope
Much of the work of a powder diffraction laboratory has been automated by interfacing the diffractometer to an Argus 500 computer. The system can be programmed to scan the diffraction patterns, locate diffraction peaks and determine line‐profile parameters for up to 35 samples presented sequentially. A limited capacity for automatic phase identification has also been developed. The characteristics of the system in practical operation are discussed and it is concluded that the capacity for continuous operation and rapid data processing effectively outweight such disadvantages as have been observed.