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Phase identification in the cobalt–samarium system with computer‐simulated electron diffraction patterns
Author(s) -
Rao P.,
Goehner R. P.
Publication year - 1974
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889874010247
Subject(s) - samarium , electron diffraction , diffraction , materials science , phase (matter) , cobalt , crystallography , alloy , identification (biology) , crystal structure , chemistry , optics , physics , metallurgy , inorganic chemistry , botany , organic chemistry , biology
Computer‐simulated electron diffraction patterns can be effectively utilized in phase identification in complex alloy systems. The problem of phase identification becomes particularly acute when several alloy phases with related lattice parameters coexist, resulting in overlapping diffraction spots. Such overlapping patterns can make unambiguous phase identification tedious, if not impossible. A complex alloy system, such as the cobalt–samarium system, is ideally suited for such study. Computer‐simulated diffraction patterns have been used to identify the presence of rhombohedral Co 17 Sm 2 and a disordered Co 7 Sm 2 type structure in annealed Co 5 Sm single crystals. Apart from the ease in identification of co‐existent phases, computation of electron diffraction patterns also helps in confirming the indexing of complex patterns especially when several phases can be expected to be present. The use of the cobalt–samarium system for an indirect method of crystal‐thickness measurement is discussed.