Premium
X‐ray diffraction studies of thin gold films using the variance method
Author(s) -
Langford J. I.,
Tapia J.
Publication year - 1974
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889874010053
Subject(s) - crystallite , diffraction , materials science , dislocation , maxima , thin film , crystallography , substrate (aquarium) , crystal (programming language) , single crystal , condensed matter physics , analytical chemistry (journal) , optics , chemistry , nanotechnology , physics , geology , art , programming language , oceanography , chromatography , performance art , computer science , art history
The variance of X‐ray diffraction maxima is used in an investigation of the properties of thin gold films deposited on single‐crystal KCl substrates. The state of the films depends on the temperature of the substrate during deposition. Crystallites having (100) and (111) orientations are present at temperatures below about 150°C, but no 111 reflexions are observed above this temperature. There is evidence of dislocations only for 100 reflexions and the dislocation density is a maximum at about 100°C, when the crystallite size is a minimum. The size is roughly constant for the 111 reflexions.