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Phénomènes de diffraction produits par les systèmes stratifiés à distribution d'atomes partiellement différente de couche à couche
Author(s) -
Besson G.,
Tchoubar C.,
Méring J.
Publication year - 1974
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889874009782
Subject(s) - lamellar structure , reciprocal lattice , crystallography , diffraction , electron diffraction , reciprocal , materials science , distribution (mathematics) , layer (electronics) , chemistry , condensed matter physics , physics , optics , nanotechnology , mathematics , mathematical analysis , linguistics , philosophy
Order–disorder relations have been studied by electron diffraction in a lamellar system consisting of stacked layers in which some atoms are partially disordered. The analysis of a single reciprocal‐space section permits the derivation of the defect distribution in a layer as a whole if there is no correlation between the distribution of defects in different layers. The method is applied to the study of isomorphic substitutions in microcrystallized layer silicates such as beidellite and illite.