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Detection of the contribution of harmonics to the diffracted X‐ray intensity
Author(s) -
Barnea Z.,
Mohyla J.
Publication year - 1974
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889874009599
Subject(s) - monochromator , harmonics , diffraction , optics , harmonic , intensity (physics) , radiation , acceleration voltage , reflection (computer programming) , absorption (acoustics) , wavelength , materials science , physics , voltage , acoustics , quantum mechanics , cathode ray , computer science , programming language , electron
The appreciable differences between the absorption coefficients of a foil for the characteristic radiation and its harmonics can be utilized to determine the wavelength composition of X‐rays diffracted by a monochromator or sample. A simple experimental procedure is proposed and used to determine the intensity of the λ/2 harmonic diffracted by the 400 reflection of gallium phosphide at the 200 position of the molybdenum K α peak. At a tube voltage of 45 kV the λ/2 contribution was found to be 9%; it decreased to 2.5% when pulse‐height discrimination blocked 10% of the total counts. Our procedure provides a direct check of the effectiveness of balanced filters and electronic discrimination against harmonic radiation.