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Evidence of escape peaks caused by a Si(Li) detector in energy‐dispersive diffraction spectra
Author(s) -
Buras B.,
Olsen J. S.,
Andersen A. L.,
Gerward L.,
Selsmark B.
Publication year - 1974
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889874009587
Subject(s) - diffraction , spectral line , detector , silicon , energy (signal processing) , materials science , optics , analytical chemistry (journal) , molecular physics , physics , atomic physics , crystallography , chemistry , optoelectronics , chromatography , quantum mechanics , astronomy
The appearance and identification of silicon K α escape peaks in energy‐dispersive X‐ray diffraction spectra are reported.