Low‐temperature, high‐pressure X‐ray cell | Zendy

Morosin B. | Zendy; Schirber J. E. | Zendy

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Low‐temperature, high‐pressure X‐ray cell

Author(s) -

Morosin B.,

Schirber J. E.

Publication year - 1974

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s0021889874009575

Subject(s) - diffractometer , beryllium , phase diagram , atmospheric temperature range , thermodynamics , materials science , x ray , phase (matter) , crystallography , chemistry , analytical chemistry (journal) , crystal structure , physics , optics , organic chemistry , chromatography

A beryllium high‐pressure cell (0–4 kbar), suitable for single‐crystal studies, has been constructed so that it can be mounted either on a standard diffractometer or on other X‐ray instruments and can operate over the temperature range 80–300°K. This cell has been used to determine the linear compressibilities of various materials as well as to determine shifts in atomic position with pressure of simple materials. More recently, the symmetry of phases in the pressure‐temperature phase diagram for (CH 3 ) 4 NMnCl 3 has been determined.

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