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Low‐temperature, high‐pressure X‐ray cell
Author(s) -
Morosin B.,
Schirber J. E.
Publication year - 1974
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889874009575
Subject(s) - diffractometer , beryllium , phase diagram , atmospheric temperature range , thermodynamics , materials science , x ray , phase (matter) , crystallography , chemistry , analytical chemistry (journal) , crystal structure , physics , optics , organic chemistry , chromatography
A beryllium high‐pressure cell (0–4 kbar), suitable for single‐crystal studies, has been constructed so that it can be mounted either on a standard diffractometer or on other X‐ray instruments and can operate over the temperature range 80–300°K. This cell has been used to determine the linear compressibilities of various materials as well as to determine shifts in atomic position with pressure of simple materials. More recently, the symmetry of phases in the pressure‐temperature phase diagram for (CH 3 ) 4 NMnCl 3 has been determined.