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A method of obtaining a highly parallel and monochromatic X‐ray beam by successive diffraction
Author(s) -
Matsushita T.
Publication year - 1974
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889874009496
Subject(s) - monochromator , diffraction , bent molecular geometry , optics , beam (structure) , collimator , monochromatic color , germanium , wavelength , silicon , materials science , physics , optoelectronics , composite material
A beam of Cu K α 1 with an angular spread 1.0 × 10 −5 radian and a wavelength spread (δλ/λ) = 0.8 × 10 −5 was obtained by a silicon monochromator–collimator system. It consisted of two crystal elements in which the 620 and 333 reflections occurred successively. The two elements, originally monolithic, were cut after they had been glued to two metal blocks connected by a leaf spring. In order to satisfy the diffraction conditions in the two elements, one element was rotated about 10′ with respect to the other by bending the leaf spring. Using this beam, rocking curves of germanium single crystals were measured for the 220, 440 and 222 reflections. The half‐value widths of the experimental curves were found to be 12.93± 0.01′′ for the 220 and 5.88±0.01′′ for 440 which are in good agreement with those of calculated convolution curves, 12.94 and 5.88′′ respectively. The integrated intensity of 222 was 1.59±0.1 × 10−8. From this value the structure factor of 222 was determined to be 1.05±0.08.