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Investigations at the tail end of the small‐angle X‐ray region
Author(s) -
Brady G. W.
Publication year - 1974
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889874009265
Subject(s) - small angle x ray scattering , small angle scattering , scattering , diffraction , physics , optics , solid angle , x ray , x ray crystallography , materials science , detector
There is a region in the X‐ray diffraction pattern between s = 0.1 and s = 1.0 ( s = 4π sin θ/λ) which is not generally amenable to investigation by conventional small‐angle X‐ray techniques because the small‐angle scattering is too faint.
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