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Current use of position‐sensitive proportional counters for small‐angle X‐ray scattering and diffraction
Author(s) -
Dupont Y.,
Gabriel A.,
Chabre M.,
Luzzati V.
Publication year - 1974
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889874008909
Subject(s) - diffraction , position (finance) , current (fluid) , optics , scattering , small angle x ray scattering , small angle scattering , physics , x ray crystallography , x ray , materials science , finance , economics , thermodynamics
The most interesting property of this detector is a considerable shortening of the exposure time needed to record the data. The experimental set‐up is described. The advantages and limitations of this type of detector compared with the standard film or counter detection are discussed.