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X‐ray study on thin gold films
Author(s) -
Seitsonen S.,
Inkinen P.
Publication year - 1974
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889874008715
Subject(s) - optics , materials science , line (geometry) , x ray , maxima , thin film , fourier transform , angstrom , constant (computer programming) , analytical chemistry (journal) , crystallography , chemistry , physics , geometry , nanotechnology , mathematics , art , programming language , chromatography , quantum mechanics , performance art , computer science , art history
Gold films of several hundred Ångströms in thickness were evaporated on heated glass substrates. Fourier analysis of the 111 reflexion obtained with Cu K α radiation showed that the thickness of the film must be fairly constant. After correction for instrumental broadening the 111 line profile was very similar to the theoretical profile of a reflexion from a plate of constant thickness. The thickness was measured in three different ways. It was shown that the first secondary maxima may be unreliable in the measurement of the thickness.