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Measurement of the lattice parameter of gadolinium gallium garnet crystals by the X‐ray divergent‐beam anomalous‐transmission method
Author(s) -
Glass H. L.,
Moudy L. A.
Publication year - 1974
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889874008636
Subject(s) - gadolinium gallium garnet , lattice (music) , lattice constant , materials science , wafer , gallium , gadolinium , conic section , optics , diffraction , physics , geometry , mathematics , optoelectronics , epitaxy , nanotechnology , layer (electronics) , acoustics , metallurgy
X‐ray divergent‐beam anomalous‐transmission patterns of [111] Gd 3 Ga 5 O 12 crystal wafers cut from Czochralski‐grown boules were obtained with Co radiation. The patterns contained {800} K α transmission conics which just miss having a triple intersection. The intersection region was analyzed to determine the lattice parameter. The values of lattice parameter for wafers cut from several different boules ranged from 12.3807 to 12.383 Å with an estimated precision of ±0.0004 Å. The method is simple and non‐destructive and offers sufficient precision to investigate compositional variations and to evaluate the crystals in terms of lattice parameter matching requirements for epitaxic film deposition.