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Precision of a rotating‐drum film scanner
Author(s) -
Wlodawer A.
Publication year - 1974
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889874008624
Subject(s) - scanner , microdensitometer , drum , reproducibility , reliability (semiconductor) , optics , scaling , scale factor (cosmology) , materials science , computer science , physics , mathematics , engineering , mechanical engineering , statistics , geometry , power (physics) , cosmology , quantum mechanics , metric expansion of space , dark energy
Precession X‐ray films were scanned with a rotating‐drum microdensitometer. It is necessary to correct for non‐linearity between the scanner input and output. Reliability factors for estimating the precision of scanner measurements are compared. The values of the symmetry‐averaged reliability factor, R sym , vary between 3.9 and 12% and depend strongly on the quality of films, while the values of the scanning reproducibility factor, R rept (3.5–4%), and the film‐scaling reliability factor, R scale (4.5–5.5%), depend more on the quality of scanner software and electronics than on films.