z-logo
Premium
On the correction of the shapes of X‐ray diffraction line profiles for absorption broadening
Author(s) -
Dineen C.
Publication year - 1973
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889873009258
Subject(s) - diffraction , absorption (acoustics) , line (geometry) , materials science , optics , x ray , analytical chemistry (journal) , chemistry , physics , geometry , chromatography , mathematics
It has been shown that the method of Keating & Warren [ Rev. Sci. Instrum . (1952), 23 , 519–522] for performing correction to the shapes of X‐ray profiles in order to allow for absorption broadening can lead to serious errors for materials with a low absorption coefficient. The factors influencing the degree of absorption broadening are reconsidered and the Keating & Warren analysis is re‐presented in the light of these considerations. The analysis is illustrated by correcting the 0004 X‐ray diffraction profile derived from a lightly pressed graphitized carbon.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom