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Rentgenograficheskoe izucheniye tonkoy strukturi plenok geksagonalnogo GaTe
Author(s) -
Dapkus L. Z.,
Lisauskas V. S.,
Davydov G. V.
Publication year - 1973
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889873009222
Subject(s) - hexagonal crystal system , thin film , materials science , moment (physics) , crystallography , condensed matter physics , physics , nanotechnology , chemistry , quantum mechanics
The results of an X‐ray investigation of thin‐structure parameters of textured hexagonal GaTe films by the fourth‐moment method are given. A correlation between the thin structure and some of the physical properties of the films is shown.