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Escape peaks caused by a Ge(Li) detector in an energy‐dispersive diffractometer
Author(s) -
Fukamachi T.,
Togawa S.,
Hosoya S.
Publication year - 1973
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889873008745
Subject(s) - diffractometer , detector , energy (signal processing) , diffraction , energy spectrum , optics , materials science , physics , identification (biology) , analytical chemistry (journal) , crystallography , chemistry , nuclear physics , scanning electron microscope , biology , quantum mechanics , botany , chromatography
The appearance and identification of escape peaks in an energy‐dispersive X‐ray diffraction spectrum are reported.