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An X‐ray study of β‐tantalum
Author(s) -
Burbank R. D.
Publication year - 1973
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889873008502
Subject(s) - tantalum , hexagonal crystal system , crystallography , materials science , precession , x ray , orientation (vector space) , impurity , plane (geometry) , geometry , condensed matter physics , optics , chemistry , physics , mathematics , organic chemistry , metallurgy
A 7.5μ thick β‐Ta film with very high preferred orientation has been studied with both the Gandolfi and precession cameras. A hexagonal subcell with a = 2.831, c = 5.337 Å has been found. The smallest hexagonal cell that accounts for all the observed spacings contains 144 subcells with a = 34 Å. A structural model is proposed based on analysis of the subcell. It suggests that there are domains in the form of hexagonal prisms about 1000 Å or more in height and about 250 Å in diameter. The domains are divided into 12 coherently diffracting prismatic zones with impurity species, principally Ar and H 2 , incorporated into the zone boundaries. The structure within a zone is related to the simple h.c.p. structure. The domains are stacked together side by side, normal to the plane of the film, to form layers. Many layers in turn may be added together to form the complete film.