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The direct observation of the structure of real crystals by lattice imaging
Author(s) -
Allpress J. G.,
Sanders J. V.
Publication year - 1973
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889873008459
Subject(s) - lattice (music) , image contrast , electron microscope , optics , microscope , materials science , cathode ray , direct imaging , electron , physics , quantum mechanics , acoustics
The electron‐microscope technique of lattice imaging can in favourable circumstances be used to observe the structure of materials directly. The technique is described, and examples of cases in which a direct correlation between image contrast and structural features has been established are given. Procedures for computing contrast in n ‐beam lattice images are outlined, and the important experimental parameters, thickness and orientation of the specimen, and spherical aberration and defocusing of the microscope objective, are discussed in some detail.

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