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The measurement of single‐crystal lattice parameters using a double‐diffraction technique
Author(s) -
Spooner F. J.,
Wilson C. G.
Publication year - 1973
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889873008290
Subject(s) - diffraction , lattice (music) , triple point , gallium arsenide , lattice constant , optics , materials science , x ray crystallography , wavelength , condensed matter physics , crystallography , physics , chemistry , quantum mechanics , acoustics
A modified double‐diffraction technique is described for the accurate measurement of lattice parameters of (100) slices of gallium arsenide. The method relies on the selection of appropriate reflexions for producing a pseudo‐point of triple diffraction, and the determination of the wavelength necessary to produce such a triple point. Results are presented which show that lattice parameters can be determined rapidly and simply to better than 1 in 10 5 .