The measurement of single‐crystal lattice parameters using a double‐diffraction technique | Zendy

Spooner F. J. | Zendy; Wilson C. G. | Zendy

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The measurement of single‐crystal lattice parameters using a double‐diffraction technique

Author(s) -

Spooner F. J.,

Wilson C. G.

Publication year - 1973

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s0021889873008290

Subject(s) - diffraction , lattice (music) , triple point , gallium arsenide , lattice constant , optics , materials science , x ray crystallography , wavelength , condensed matter physics , crystallography , physics , chemistry , quantum mechanics , acoustics

A modified double‐diffraction technique is described for the accurate measurement of lattice parameters of (100) slices of gallium arsenide. The method relies on the selection of appropriate reflexions for producing a pseudo‐point of triple diffraction, and the determination of the wavelength necessary to produce such a triple point. Results are presented which show that lattice parameters can be determined rapidly and simply to better than 1 in 10 5 .

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