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An incident‐beam ionization chamber and charge integration system for stabilization of X‐ray diffraction experiments
Author(s) -
Hendricks R. W.,
De Lorenzo J. T.,
Glass F. M.,
Zedler R. E.
Publication year - 1973
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889873008289
Subject(s) - diffraction , beam (structure) , ionization , scattering , optics , integrator , ionization chamber , atomic physics , instability , physics , materials science , voltage , ion , quantum mechanics , mechanics
A low‐absorption ionization chamber has been developed to monitor the incident beam in X‐ray diffraction experiments. The chamber current is digitized by means of an ultra‐stable linear charge integrator. The digital signal is used to control the measuring time for each point of the desired scattering curve. In our application, fluctuations in the scattering curve resulting from instability of the incident beam have been reduced by a factor of 5.