Unit‐cell dimension measurements from pairs of X‐ray diffraction lines | Zendy

Popović S. | Zendy

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Unit‐cell dimension measurements from pairs of X‐ray diffraction lines

Author(s) -

Popović S.

Publication year - 1973

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s0021889873008277

Subject(s) - diffraction , reflection (computer programming) , dimension (graph theory) , optics , unit (ring theory) , wavelength , physics , x ray , materials science , computational physics , mathematics , computer science , combinatorics , mathematics education , programming language

A method is described for precise unit‐cell dimension measurements based on the accurate recording of the angular separation between two neighbouring orders of reflection which may correspond to different wavelengths. A number of pairs of reflections at high diffraction angles are used and a least‐squares refinement is performed after taking into account the angular dependence of systematic aberrations. The method has been tested on Ge and several selenides (InSe, In 2 Se 3 , GaSe) and the accuracy of the results is discussed.

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