Premium
Intérêt du filtrage des énergies en diffraction electronique
Author(s) -
Duval P.,
Henry L.
Publication year - 1973
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889873008253
Subject(s) - electron diffraction , diffraction , optics , inelastic scattering , physics , scattering , electron , materials science , nuclear physics
Energy‐filtered electron‐diffraction patterns may be of the same interest as X‐ray diagrams in measuring diffuse scattering intensities. By removing the inelastic component from the electron diffracted beam, some diffraction patterns are compared with those obtained by X‐rays from the same materials.