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A method for analyzing image distortion in diffraction topographs
Author(s) -
Kingman P. W.
Publication year - 1973
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889873007983
Subject(s) - distortion (music) , diffraction , image (mathematics) , optics , point (geometry) , differential (mechanical device) , crystal (programming language) , manifold (fluid mechanics) , transformation (genetics) , physics , geometry , computer science , materials science , computer vision , mathematics , chemistry , engineering , optoelectronics , amplifier , cmos , mechanical engineering , biochemistry , gene , thermodynamics , programming language
The X‐ray diffraction topograph may be considered as a mapping of a crystal region onto a photographic film or plate. Such a mapping can be described mathematically as a point transformation on a manifold:where majuscules refer to the crystal and minuscules to the topographic image. When the topographic image is distorted because of the diffraction camera geometry, this distortion can be analyzed by utilizing the principles of differential geometry. A procedure for extracting the true spatial configuration from the distorted image is discussed and a specific application presented.