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Correction des oscillations dans les distributions de tailles de particules obtenues à partir des profils de raies de diffraction
Author(s) -
De Bergevin F.,
Germi P.
Publication year - 1972
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889872010052
Subject(s) - spurious relationship , physics , diffraction , range (aeronautics) , asymptote , distribution function , optics , materials science , mathematics , statistics , thermodynamics , mathematical analysis , composite material
The particle size distributions calculated from diffraction profiles are often disturbed by spurious oscillations. We propose a method for suppressing or reducing the parasitic effects due to wrong correction of the peak at the origin (zero size) and incorrect background. The method uses a single correction function, of the form K sin X / X , K being determined from the intercept of the variance–range function asymptote. The discussion considering a theoretical example shows that a big error may remain near the origin of the distribution (very small particle size) but that for other sizes, the results are generally better than those obtained when one fixes the distribution at its correct value at the origin.