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A unified theory of absolute intensity measurements in small‐angle X‐ray scattering
Author(s) -
Hendricks R. W.
Publication year - 1972
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889872009690
Subject(s) - collimated light , scattering , optics , attenuation , detector , intensity (physics) , ionization , beam (structure) , physics , small angle scattering , computational physics , atomic physics , materials science , laser , ion , quantum mechanics
A general equation relating the intensity (in electron units) scattered at small angles by a sample to the power received by the X‐ray detector in a small‐angle collimation system is developed which includes the effects of a nonuniform incident beam and of a nonuniformly sensitive detector. The theoretical bases for various experimental methods of measurement of the power in the incident beam are discussed. These include primary methods such as ionization chambers and attenuation by multiple foils or mechanical devices, and secondary methods which involve the measurement of scattering from standards such as gases, liquids, or amorphous scatterers for which the scattering may also be computed in absolute units.