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Fourier analysis of the line profiles of talc synthesized from sepiolite
Author(s) -
Nakajima Y.,
Watanabe T.,
Sudo T.
Publication year - 1972
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889872009495
Subject(s) - talc , sepiolite , mineralogy , materials science , fourier transform , displacement (psychology) , line (geometry) , reflection (computer programming) , perpendicular , anisotropy , plane (geometry) , hydrothermal circulation , analytical chemistry (journal) , composite material , chemistry , optics , geology , mathematics , geometry , physics , mathematical analysis , chromatography , organic chemistry , raw material , psychology , seismology , computer science , psychotherapist , programming language
The Fourier coefficients of the line profiles of talc synthesized from sepiolite under hydrothermal conditions (temperatures: 300°C~525; pressure 500 atm) were calculated and interpreted using the method of Warren & Averbach [ J. Appl. Phys . (1950), 21 , 595; (1952), 23 , 497, 1095]. The mean thickness normal to the layer plane of talc synthesized from α‐sepiolite is larger than that from β‐sepiolite, and the mean thickness for each type of synthesis product tends to increase with higher temperatures of synthesis. The mean square displacement, 〈 Z 2 1 〉, of unit cells in a column of cells perpendicular to the reflection plane generally tends to decrease with higher temperatures of synthesis. The particle‐size distribution suggests that particles tend to grow along the c * direction, since the distribution is that of nearly integer multiples of thickness.