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The application of truncated integrated intensity to the analysis of broadened X‐ray diffraction lines
Author(s) -
Cheary R. W.,
Grimes N. W.
Publication year - 1972
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889872008775
Subject(s) - diffraction , range (aeronautics) , intensity (physics) , computational physics , x ray crystallography , optics , physics , materials science , chemistry , composite material
It is shown that the function (truncated integrated intensity × range) versus range has similar theoretical merits to the variance–range function for the analysis of broadened X‐ray diffraction lines. A large number of diffraction lines with a range of breadths, provided by samples of lithium ferrite, are analysed by both methods and found to give closely comparable results for the Wilson parameter A ′(0)/ A (0). In each case the influence of the K α satellite group is eliminated by exploiting its intensity distribution derived with the aid of the centroid range function. The effects of non‐linear range dependent terms on the measured variance slopes and their equivalents from the new analysis are also discussed.