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Die Entwicklung eines Messverfahrens für Röntgenintensitäten auf photographischem Wege
Author(s) -
Berking B.
Publication year - 1972
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889872008635
Subject(s) - microdensitometer , calibration , optics , chart , materials science , physics , mathematics , statistics , quantum mechanics
A convenient method for film X‐ray microdensitometer measurement of integrated reflexions is discussed in which the intensity is converted to the amplitude of a chart recorder using an empirical calibration. Applications of the method are given.
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