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Ein einfaches Verfahren zur Bestimmung der höchsten durch Röntgenlinien‐Verbreiterung erfassbaren Kristallitengrössen
Author(s) -
Malčič S.
Publication year - 1971
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889871007593
Subject(s) - crystallite , materials science , extrapolation , physics , mathematics , metallurgy , mathematical analysis
The van Arkel doublet separation in X‐ray diffractograms of well‐crystallized reference samples is used to find by extrapolation the maximum crystallite size which can be determined for a given instrumental arrangement from line broadening.