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An X‐ray diffraction method for lattice parameter measurements from corresponding K α and K β reflexions
Author(s) -
Popović S.
Publication year - 1971
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889871006769
Subject(s) - diffraction , lattice constant , x ray , lattice (music) , sensitivity (control systems) , optics , materials science , computational physics , x ray crystallography , physics , engineering , electronic engineering , acoustics
A method is proposed for precise parameter measurements based on the accurate recording of angular separation between Kα and Kβ diffraction lines. The accuracy and sensitivity of the method are discussed.