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Precision determination of lattice parameters at low temperatures without the use of liquid gases
Author(s) -
Woodard C. L.,
Straumanis M. E.
Publication year - 1971
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889871006708
Subject(s) - cryostat , liquid helium , lattice constant , lattice (music) , materials science , diffraction , helium , thermal , thermal expansion , analytical chemistry (journal) , optics , chemistry , composite material , thermodynamics , atomic physics , condensed matter physics , chromatography , physics , acoustics , superconductivity
The design of a vacuum jacketed multiple‐exposure back‐reflection camera and the adaptation of this camera to a closed circuit pressurized helium cryostat has made it possible to determine lattice parameters by X‐ray diffraction to temperatures as low as 25 °K without liquid gases. The advantages of this new design are: short exposure periods (5 to 30 minutes), multiple (usually 6) exposures on a single film at any temperature between 25 and 180 °K, elimination of film shrinkage and hence, high precision lattice constants and thermal expansion coefficient determinations; easy detection of phase transformations. The lowest temperatures can be reached in 30 minutes.