Premium
Analysis of polymeric X‐ray diffraction profiles. II. The significance of the fourth moment–range function of the diffraction profile in the analysis of first order reflexions
Author(s) -
Kulshreshtha A. K.,
Kothari N. R.,
Dweltz N. E.
Publication year - 1971
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889871006472
Subject(s) - fortran , diffraction , range (aeronautics) , moment (physics) , x ray crystallography , lattice (music) , function (biology) , crystallography , computational physics , materials science , chemistry , physics , statistical physics , optics , computer science , quantum mechanics , composite material , evolutionary biology , acoustics , biology , operating system
An expression has been developed for the fourth moment–range function of an X‐ray diffraction profile in terms of the effects of finite crystal size and type II lattice distortions. A methodology has also been developed for its determination, which would be valuable in the analysis of the first order peaks from fibrous polymers. A computer program written in Fortran II for an IBM 1620 Computer, is described for this purpose.